Patent · US Active

Error protection for integrated circuits

US9043683B2 · kind B2 · utility

1Cited by
72References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 23, 2013
Grant dateMay 26, 2015
Priority date
Expiry dateMay 30, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03M13/29
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A method for providing error detection and/or correction to an array of storage cells includes determining a sensitive direction and an insensitive direction of the storage cells and adding a first error control mechanism to the array of storage cells in the insensitive direction. The method also includes adding a second error control mechanism to the array of storage cells in the sensitive direction. The second error control mechanism has a higher Hamming distance than the first error control mechanism.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.