Patent · US Active

Tunable multi-zone gas injection system

US9051647B2 · kind B2 · utility

31Cited by
59References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 23, 2009
Grant dateJun 9, 2015
Priority date
Expiry dateSep 5, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/3344
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A tunable multi-zone injection system for a plasma processing system for plasma processing of substrates such as semiconductor wafers. The system includes a plasma processing chamber, a substrate support for supporting a substrate within the processing chamber, a dielectric member having an interior surface facing the substrate support, the dielectric member forming a wall of the processing chamber, a gas injector fixed to part of or removably mounted in an opening in the dielectric window, the gas injector including a plurality of gas outlets supplying process gas at adjustable flow rates to multiple zones of the chamber, and an RF energy source such as a planar or non-planar spiral coil which inductively couples RF energy through the dielectric member and into the chamber to energize the process gas into a plasma state. The injector can include an on-axis outlet supplying process gas at a first flow rate to a central zone and off-axis outlets supplying the same process gas at a second flow rate to an annular zone surrounding the central zone. The arrangement permits modification of gas delivery to meet the needs of a particular processing regime by allowing independent adjustment…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.