Patent · US Active

Method and system for a gallium nitride vertical transistor

US9059199B2 · kind B2 · utility

3Cited by
0References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 7, 2013
Grant dateJun 16, 2015
Priority date
Expiry dateJan 7, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/812
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A vertical JFET includes a GaN substrate comprising a drain of the JFET and a plurality of patterned epitaxial layers coupled to the GaN substrate. A distal epitaxial layer comprises a first part of a source channel and adjacent patterned epitaxial layers are separated by a gap having a predetermined distance. The vertical JFET also includes a plurality of regrown epitaxial layers coupled to the distal epitaxial layer and disposed in at least a portion of the gap. A proximal regrown epitaxial layer comprises a second part of the source channel. The vertical JFET further includes a source contact passing through portions of a distal regrown epitaxial layer and in electrical contact with the source channel, a gate contact in electrical contact with a distal regrown epitaxial layer, and a drain contact in electrical contact with the GaN substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.