Patent · US Active

Dual three-dimensional (3D) resistor and methods of forming

US9064786B2 · kind B2 · utility

7Cited by
19References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 14, 2013
Grant dateJun 23, 2015
Priority date
Expiry dateMar 14, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Various embodiments include dual three-dimensional (3D) resistor structures and methods of forming such structures. In some embodiments, a dual 3D resistor structure includes: a dielectric layer having a first set of trenches extending in a first direction through the dielectric layer; and a second set of trenches overlayed on the first set of trenches, the second set of trenches extending in a second direction through the dielectric layer, the second set of trenches and the first set of trenches forming at least one dual 3D trench; and a resistor material overlying the dielectric layer and at least partially filling the at least one dual 3D trench along the first direction and the second direction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.