Patent · US Active

Removing method

US9070635B2 · kind B2 · utility

4Cited by
1References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 9, 2013
Grant dateJun 30, 2015
Priority date
Expiry dateAug 9, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/021
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A removing method including the following steps. A substrate is transferred into an etching machine, wherein the substrate has a material layer formed thereon. A cycle process is performed. The cycle process includes performing an etching process to remove a portion of the material layer, and performing an annealing process to remove a by-product generated by the etching process. The cycle process is repeated at least one time. The substrate is transferred out of the etching machine. In the removing method of the invention, the cycle process is performed multiple times to effectively remove the undesired thickness of the material layer and reduce the loading effect.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.