Inventor · Tainan, TW

Chin-I Liao

36Patents
9h-index
38Co-inventors
71Inventor score

Filing activity: Feb 24, 1999 → Aug 29, 2016

Most-cited inventions

PatentTitleAreaCited byStatus
USD421650S Electrical fan General 24 Expired
US9123744B1 Semiconductor device and method for fabricating the same Electricity 16 Active
US8796695B2 Multi-gate field-effect transistor and process thereof Electricity 14 Active
US9450047B1 Semiconductor structure having enlarged regrowth regions and manufacturing method of the same Electricity 14 Active
US8647953B2 Method for fabricating first and second epitaxial cap layers Electricity 13 Active
US8754448B2 Semiconductor device having epitaxial layer Electricity 12 Active
US7736982B2 Method for forming a semiconductor device Electricity 10 Active
US7357686B2 Boat propeller with adjustable blades for adjusting the pitch thereof Performing Operations; Transporting 9 Active
US9337193B2 Semiconductor device with epitaxial structures Electricity 9 Active
US9006805B2 Semiconductor device Electricity 8 Active
US8674433B2 Semiconductor process Electricity 7 Active
US8710632B2 Compound semiconductor epitaxial structure and method for fabricating the same Electricity 6 Active
US9620503B1 Fin field effect transistor and method for fabricating the same Electricity 5 Active
US9070635B2 Removing method Electricity 4 Active
US9064893B2 Gradient dopant of strained substrate manufacturing method of semiconductor device Electricity 4 Active
US6139270A Electric fan Mechanical Engineering; Lighting; Heating 4 Expired
US8476169B2 Method of making strained silicon channel semiconductor structure Electricity 3 Active
US8440511B1 Method for manufacturing multi-gate transistor device Electricity 3 Active
US9614085B2 Semiconductor structure having enlarged regrowth regions and manufacturing method of the same Electricity 2 Active
US9112030B2 Epitaxial structure and process thereof for non-planar transistor Electricity 2 Active
US9543439B2 Semiconductor device structure and manufacturing method thereof Electricity 1 Active
US8928126B2 Epitaxial layer Electricity 1 Active
US8519390B2 Test pattern for measuring semiconductor alloys using X-ray Diffraction Electricity 1 Active
US7858529B2 Treatment method of semiconductor, method for manufacturing MOS, and MOS structure Electricity 0 Active
US8481391B2 Process for manufacturing stress-providing structure and semiconductor device with such stress-providing structure Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.