Patent · US Active

Wear-out equalization techniques for multiple functional units

US9087146B2 · kind B2 · utility

6Cited by

4References

26Claims

0Family size

Assignee

Intel Corporation · US

Inventors

Stefan Rusu · Sunnyvale, US
Zhiguo Wang · Dachau, DE
Krishnakanth V. Sistla · Beaverton, US

Key dates

Filing date	Dec 21, 2012
Grant date	Jul 21, 2015
Priority date	—
Expiry date	Sep 30, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3055
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Wear-out equalization techniques for multiple functional hardware units are disclosed. An integrated circuit includes a power control unit (PCU) configured to monitor indicators of wear-out incurred by multiple functional hardware units of the integrated circuit. The PCU calculates cumulative wear-out metrics of the functional hardware units based on the monitored indicators and performs an equalization action to equalize the cumulative wear-out metrics of the functional hardware units.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.