Patent · US Active

Shape measuring machine and method of correcting shape measurement error

US9091522B2 · kind B2 · utility

4Cited by
0References
10Claims
0Family size

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Key dates

Filing dateAug 20, 2013
Grant dateJul 28, 2015
Priority date
Expiry dateFeb 13, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B21/045
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A shape measuring machine includes a slider that supports a scanning probe. A scale unit detects a displacement of the slider. A tip sphere displacement detection unit detects a displacement of the tip sphere. A calculation unit includes a correction filter including a first and second filters and an adder, and calculates a measurement value from the displacements of the slider and the tip sphere. The first filter corrects the displacement of the slider based on a frequency transfer characteristic from the scale unit to the tip of the slider. The second filter outputs a value that is obtained by correcting a value corrected by the first filter based on a frequency transfer characteristic from the tip of the slider to the tip sphere as the correction value. The adder outputs a measurement value obtained by adding the correction value and the displacement of the tip sphere.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.