Nobuhiro Ishikawa
28Patents
7h-index
16Co-inventors
66Inventor score
Filing activity: Jun 24, 1997 → Jul 17, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6044569A | Measuring method and measuring instrument | Physics | 63 | Expired |
| US8229694B2 | Coordinate measuring machine | Physics | 17 | Active |
| US6360176B1 | Touch signal probe | Physics | 13 | Expired |
| US9746303B2 | Coordinate measuring machine and method for calculating correction matrix by coordinate measuring machine | Physics | 11 | Active |
| US5949257A | DC level transition detecting circuit for sensor devices | Electricity | 11 | Expired |
| US7660688B2 | Surface-profile measuring instrument | Physics | 10 | Active |
| US8332173B2 | Coordinate measuring machine | Physics | 8 | Active |
| US7464481B2 | Measuring apparatus, method of measuring surface texture and computer readable medium having program for measuring surface texture | Physics | 7 | Active |
| US7319909B2 | Position control device, measuring device and machining device | Physics | 6 | Active |
| US10429167B2 | Coordinate correction method and coordinate measuring machine | Physics | 5 | Active |
| US10415949B2 | Measuring probe | Physics | 5 | Active |
| US9464877B2 | Shape measuring apparatus and shape measurement error correction method | Physics | 5 | Active |
| US9097504B2 | Shape measuring machine and method of correcting shape measurement error | Physics | 5 | Active |
| US6507404B1 | Method and apparatus for measuring optical wavelength | Physics | 4 | Expired |
| US9091522B2 | Shape measuring machine and method of correcting shape measurement error | Physics | 4 | Active |
| US5922964A | Amplitude detecting device | Physics | 4 | Expired |
| US10422636B2 | Coordinate measuring machine and coordinate correction method | Physics | 4 | Active |
| US9719779B2 | Form measuring machine and form measuring method | Physics | 4 | Active |
| US6215225A | Non-directional touch signal probe | Physics | 3 | Expired |
| US9062958B2 | Image sensor, attitude detector, contact probe, and multi-sensing probe | Physics | 3 | Active |
| US9683839B2 | Method of correcting measurement error of shape measuring apparatus, and shape measuring apparatus | Physics | 3 | Active |
| US10429166B2 | Coordinate measuring machine and coordinate correction method | Physics | 2 | Active |
| US6937070B2 | Amplitude-detecting method and circuit | Physics | 2 | Expired |
| US10393495B2 | Measuring probe | Physics | 1 | Active |
| US10006803B2 | Sensor signal contact detector circuit | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.