Rectified switching of two-terminal memory via real time filament formation
US9112145B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 31, 2013 |
| Grant date | Aug 18, 2015 |
| Priority date | — |
| Expiry date | Jan 31, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10N70/884
Abstract
Providing for rectified-switching of a two-terminal solid state memory cell is described herein. By way of example, the subject disclosure provides a solid state device exhibiting rectified resistive switching characteristics that can be fabricated with semiconductor fabrication techniques. The solid state device can comprise a metal ion layer adjacent to an electrically resistive diffusion layer, which is at least in part permeable to conductive ions of the metal ion layer. A pair of electrodes can be placed, respectively, on opposite sides of the adjacent ion layer and electrically resistive diffusion layer to facilitate operating on the two-terminal solid state memory cell. In operation, a program voltage induces conductive ions to form a semi-stable conductive filament within the diffusion layer, which partially deforms in response to reduction in the program voltage. A suitable rectifier voltage re-establishes electrical conductivity, with much lower electrical conductivity for voltages lower than the rectifier voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.