Patent · US Active

Process for fabricating a transistor comprising nanoscale semiconductor features using block copolymers

US9147750B2 · kind B2 · utility

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16Claims
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Key dates

Filing dateMay 25, 2013
Grant dateSep 29, 2015
Priority date
Expiry dateMay 25, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/017
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A process for fabricating one transistor, comprising a semiconductor region, comprising a source region, a drain region, and a channel region covered with a gate, comprises: production of an primary etching mask on the surface of the semiconductor region, said mask containing at least one primary aperture; depositing in said primary aperture a block copolymer containing, in alternation, at least first polymer domains and second polymer domains; removing either a series of first polymer domains or a series of second polymer domains in order to create a secondary mask containing secondary apertures; etching said active region through said secondary apertures in order to define nanoscale self-aligned semiconductor features; producing said gate on the surface of said self-aligned semiconductor features.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.