Patent · US Active

Stage apparatus and sample observation apparatus

US9171695B2 · kind B2 · utility

0Cited by
12References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 12, 2013
Grant dateOct 27, 2015
Priority date
Expiry dateApr 12, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/20264
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

In order to provide a stage apparatus with high speed stability in addition to being able to achieve positioning with a high degree of accuracy, and a sample observation apparatus, such as an optical microscope and a scanning electron microscope, including the stage apparatus, the stage apparatus and the sample observation apparatus of the present invention correct a command voltage value of standard waveform data or an output timing of a command voltage value such that a difference between a first time history response and a second time history response is reduced to zero, the first time history response for displacement or speed when the stage mechanism is driven with use of the standard waveform data showing the command voltage value at each predetermined time and the second time history response for displacement or speed when a speed of the stage mechanism is constant, to be set as drive waveform data to be outputted to a drive unit of the stage mechanism.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.