Patent · US Active

Substrate cleaning apparatus and vacuum processing system

US9214364B2 · kind B2 · utility

2Cited by
37References
13Claims
0Family size

Assignees

Inventors

Key dates

Filing dateMar 26, 2012
Grant dateDec 15, 2015
Priority date
Expiry dateSep 7, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67069
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A substrate cleaning apparatus includes a supporting unit, provided in a processing chamber having a gas exhaust port, for supporting a substrate; one or more nozzle units, each for ejecting gas clusters to a peripheral portion of the substrate supported by the supporting unit to remove unnecessary substances from the peripheral portion; and a moving mechanism for changing relative positions of the supporting unit and the nozzle unit during ejecting the gas clusters. Each nozzle unit discharges a cleaning gas having a pressure higher than that in the processing chamber so that the cleaning gas is adiabatically expanded to form aggregates of atoms and/or molecules.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.