Patent · US Active

Internal plasma grid applications for semiconductor fabrication in context of ion-ion plasma processing

US9230819B2 · kind B2 · utility

13Cited by
19References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 19, 2014
Grant dateJan 5, 2016
Priority date
Expiry dateFeb 19, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76224
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The embodiments disclosed herein pertain to improved methods and apparatus for etching a semiconductor substrate. A plasma grid assembly is positioned in a reaction chamber to divide the chamber into upper and lower sub-chambers. The plasma grid assembly may include one or more plasma grids having slots of a particular aspect ratio, which allow certain species to pass through from the upper sub-chamber to the lower sub-chamber. In some cases, an electron-ion plasma is generated in the upper sub-chamber. Electrons that make it through the grid to the lower sub-chamber are cooled as they pass through. In some cases, this results in an ion-ion plasma in the lower sub-chamber. The ion-ion plasma may be used to advantage in a variety of etching processes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.