System for testing an integrated circuit of a device and its method of use
US9250291B2 · kind B2 · utility
17Cited by
8References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 20, 2012 |
| Grant date | Feb 2, 2016 |
| Priority date | — |
| Expiry date | Jul 3, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31908
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.