Scott E. Lindsey
54Patents
17h-index
31Co-inventors
84Inventor score
Filing activity: Feb 3, 1992 → Mar 12, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5773986A | Semiconductor wafer contact system and method for contacting a semiconductor wafer | Electricity | 44 | Expired |
| US6310403A | Method of manufacturing components and component thereof | Emerging Cross-Sectional Technologies | 39 | Expired |
| US8030957B2 | System for testing an integrated circuit of a device and its method of use | Physics | 37 | Active |
| US7800382B2 | System for testing an integrated circuit of a device and its method of use | Physics | 35 | Active |
| US5217568A | Silicon etching process using polymeric mask, for example, to form V-groove for an optical fiber coupling | Physics | 32 | Expired |
| US5629630A | Semiconductor wafer contact system and method for contacting a semiconductor wafer | Physics | 30 | Expired |
| US6948940B2 | Helical microelectronic contact and method for fabricating same | Electricity | 30 | Expired |
| US8506335B2 | Apparatus for testing electronic devices | Physics | 29 | Active |
| US7053644B1 | System for testing and burning in of integrated circuits | Physics | 28 | Expired |
| US7762822B2 | Apparatus for testing electronic devices | Physics | 25 | Active |
| US8228085B2 | System for testing an integrated circuit of a device and its method of use | Physics | 23 | Active |
| US8628336B2 | Apparatus for testing electronic devices | Physics | 23 | Active |
| US9880197B2 | Controlling alignment during a thermal cycle | Physics | 20 | Active |
| US8947116B2 | System for testing an integrated circuit of a device and its method of use | Physics | 20 | Active |
| US9625521B2 | Controlling alignment during a thermal cycle | Physics | 20 | Active |
| US10401385B2 | Limiting translation for consistent substrate-to-substrate contact | Physics | 18 | Active |
| US7131848B2 | Helical microelectronic contact and method for fabricating same | Electricity | 18 | Expired |
| US11112429B2 | Pressure relief valve | Physics | 17 | Active |
| US9316683B2 | Apparatus for testing electronic devices | Physics | 17 | Active |
| US9250291B2 | System for testing an integrated circuit of a device and its method of use | Physics | 17 | Active |
| US7667475B2 | Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion | Physics | 12 | Active |
| US8118618B2 | Apparatus for testing electronic devices | Physics | 11 | Active |
| US8388357B2 | Apparatus for testing electronic devices | Physics | 10 | Active |
| US11255903B2 | Apparatus for testing electronic devices | Physics | 10 | Active |
| US11592465B2 | Pressure relief valve | Physics | 10 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.