Patent · US Active

Capacitive test device and method for capacitive testing a component

US9250293B2 · kind B2 · utility

3Cited by

4References

21Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Ming Xue · Longbeilingcun, CN
Weng Yew Kok · Singapore, SG

Key dates

Filing date	Jul 9, 2012
Grant date	Feb 2, 2016
Priority date	—
Expiry date	Jul 8, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2893
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system and a method for capacitive testing a component (including a packaged component) are disclosed. An embodiment of a test head comprises a holding unit configured to pick-up, hold and release the component, an electrode configured to receive a capacitive signal from the component and a preamplifier configured to amplify the capacitive signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.