Ming Xue
16Patents
2h-index
28Co-inventors
50Inventor score
Filing activity: Jul 14, 2010 → Jul 25, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| USD1007261S1 | Tree climbing tool | General | 4 | Active |
| US9250293B2 | Capacitive test device and method for capacitive testing a component | Physics | 3 | Active |
| US8274967B2 | Method, system and gateway for remotely accessing MPLS VPN | Electricity | 2 | Active |
| US11454094B2 | Downhole power generation system and optimized power control method thereof | Electricity | 1 | Active |
| US9456798B2 | Methods and apparatus for individually optimizing uniform contrast enhancements in computed tomography imaging | Physics | 1 | Active |
| US10678514B2 | Method and device for generating code assistance information | Physics | 0 | Active |
| US8896320B2 | Measuring device and a method for measuring a chip-to-chip-carrier connection | Physics | 0 | Active |
| US8805809B2 | Autotransform system | Physics | 0 | Active |
| US9435825B2 | Multi-channel probe plate for semiconductor package test systems | Physics | 0 | Active |
| US9121884B2 | Capacitive test method, apparatus and system for semiconductor packages | Physics | 0 | Active |
| US11555380B2 | Downhole power generation system and method | Emerging Cross-Sectional Technologies | 0 | Active |
| US11807539B2 | Heat exchanger and manufacturing method thereof | Mechanical Engineering; Lighting; Heating | 0 | Active |
| US8933722B2 | Measuring device and a method for measuring a chip-to-chip-carrier connection | Physics | 0 | Active |
| US10473712B2 | Integrated circuit device testing in an inert gas | Physics | 0 | Active |
| US12092404B2 | Heat exchanger, processing method of heat exchanger and composite material | Emerging Cross-Sectional Technologies | 0 | Active |
| US12313354B2 | Processing method of heat exchanger and heat exchanger | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.