Patent · US Active

Plasma processing apparatus, plasma processing method and storage medium

US9252001B2 · kind B2 · utility

1Cited by
2References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 27, 2014
Grant dateFeb 2, 2016
Priority date
Expiry dateAug 7, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32541
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing apparatus includes a first electrode and a second electrode so arranged in the upper portion of a processing chamber as to face a mounting table, a gas supply unit for supplying a processing gas between the first electrode and the second electrode, a RF power supply unit for applying a RF power between the first electrode and the second electrode for converting the process gas supplied between the electrodes into a plasma, and a gas exhaust unit for evacuating the inside of the processing chamber to a vacuum level from the lower portion of the processing chamber. Since the electron temperature in the plasma is low near a substrate on the mounting table, damage to the substrate caused by the plasma can be suppressed. In addition, since a metal can be used as a material for the processing chamber, the processing chamber can have good temperature controllability.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.