Patent · US Active

Device and method for measuring phase retardation distribution and fast axis azimuth angle distribution in real time

US9297744B2 · kind B2 · utility

2Cited by

1References

8Claims

0Family size

Assignee

Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences · CN

Inventors

Aijun Zeng · Shanghai, CN
Longhai Liu · Shandong, CN
Linglin Zhu · Shanghai, CN
Huijie Huang · Shanghai, CN

Key dates

Filing date	Aug 8, 2014
Grant date	Mar 29, 2016
Priority date	—
Expiry date	Sep 27, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01N2021/216
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Device and method for measuring phase retardation distribution and fast axis azimuth angle distribution of birefringence sample in real time. The device consists of a collimating light source, a circular polarizer, a diffractive beam-splitting component, a quarter-wave plate, an analyzer array, a charge coupled device (CCD) image sensor and a computer with an image acquisition card. The method can measure the phase retardation distribution and the fast axis azimuth angle distribution of the birefringence sample in real time and has large measurement range. The measurement result is immune to the light-intensity fluctuation of the light source.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.