Patent · US Active

Polymers, photoresist compositions and methods of forming photolithographic patterns

US9298093B2 · kind B2 · utility

1Cited by
3References
7Claims
0Family size

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Key dates

Filing dateDec 31, 2011
Grant dateMar 29, 2016
Priority date
Expiry dateDec 31, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/0046
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Polymers containing a unit having a particular acetal moiety and photoresist compositions containing such a polymer. Substrates coated with the photoresist compositions and methods of forming photolithographic patterns. The polymers, photoresist compositions, methods and coated substrates find particular applicability in the manufacture of semiconductor devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.