Look ahead read method for non-volatile memory
US9336891B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 2, 2014 |
| Grant date | May 10, 2016 |
| Priority date | — |
| Expiry date | Jul 2, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2211/5648
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A read operation for selected memory cell on a selected word line compensates for program disturb which is a nonlinear function of the data state of an adjacent memory cell on an adjacent word line. When a command to perform a read operation for the selected memory cell is received, a read operation is first performed on the adjacent memory cell to determine its data state, or to classify the adjacent memory cell into a threshold voltage range which includes one or more data states, or a portion of a data state. The selected memory cell is then read using a baseline control gate voltage which does not provide compensation, and one or more elevated control gate voltages which provide compensation, to distinguish between two adjacent data states. An optimal sensing result is selected based on the data state or threshold voltage range of the adjacent memory cell.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.