Patent · US Active

Methods of protecting peripheries of in-process semiconductor wafers and related in-process wafers and systems

US9337064B2 · kind B2 · utility

0Cited by
7References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 15, 2014
Grant dateMay 10, 2016
Priority date
Expiry dateSep 15, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Methods of processing semiconductor wafers may involve, for example, encapsulating an active surface and each side surface of a wafer of semiconductor material, a plurality of semiconductor devices located on the active surface of the wafer, an exposed side surface of an adhesive material located on a back side surface of the wafer, and at least a portion of a side surface of a carrier substrate secured to the wafer by the adhesive material in an encapsulation material. At least a portion of the side surface of the adhesive material may be exposed by removing at least a portion of the encapsulation material. The carrier substrate may be detached from the wafer. Processing systems and in-process semiconductor wafers are also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.