Patent · US Active

Word line address scan

US9343179B2 · kind B2 · utility

0Cited by

2References

20Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Thomas Nirschl · Putzbrunn, DE
Jens Rosenbusch · Munich, DE
Ulrich Backhausen · Taufkirchen, DE
Thomas Kern · Munich, DE
Thomas Liebermann · Munich, DE

Key dates

Filing date	Dec 18, 2013
Grant date	May 17, 2016
Priority date	—
Expiry date	Jul 3, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/22
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A system and method for performing three scans for testing an address decoder and word line drive circuits is disclosed. The first scan determines whether only one word line is selected. The second scan determines whether the word line rise time to a target voltage level is within a specified time. Finally, the third scan determines whether the correct word line was selected.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.