Testing an integrated circuit

US9354275B2 · kind B2 · utility

Assignee

• GlobalFoundries Inc. · KY

Inventors

• Birol Akdemir · Seelze, DE
• Thomas Gentner · Eppelheim, DE
• Oliver Marquardt · Ludwigsburg, DE

Key dates

• Filing date: May 20, 2014
• Grant date: May 31, 2016
• Expiry date: Aug 9, 2034

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31917
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Testing an integrated circuit in a test environment that includes a virtual test engine and a test system with an integrated circuit tester. The integrated circuit is connected to the virtual test engine via the integrated circuit tester, and the integrated circuit tester is connected to the integrated circuit via an interface. The virtual test engine communicates with the integrated circuit tester via a command interface to perform functional test during functional test mode and to perform non-functional test during non-functional test mode.