Patent · US Active

Polishing apparatus and polishing method

US9362129B2 · kind B2 · utility

4Cited by
10References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 23, 2013
Grant dateJun 7, 2016
Priority date
Expiry dateOct 23, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67219
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A polishing apparatus is used for polishing a surface of a substrate such as a semiconductor wafer to planarize the surface of the substrate. The polishing apparatus includes a polishing table having a polishing surface, and a top ring configured to hold a substrate with an outer circumferential edge of the substrate surrounded by a retainer ring and to press the substrate against the polishing surface. The top ring is movable between a polishing position above the polishing table, a position laterally of the polishing table, and a cleaning position. The polishing apparatus includes a cleaning unit disposed in the cleaning position and configured to eject a cleaning liquid toward the lower surface of the top ring, which is being rotated, thereby cleaning the substrate held by the top ring together with the lower surface of the top ring.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.