Patent · US Active

Ultra-smooth layer ultraviolet lithography mirrors and blanks, and manufacturing and lithography systems therefor

US9417515B2 · kind B2 · utility

7Cited by
23References
34Claims
0Family size

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Key dates

Filing dateDec 23, 2013
Grant dateAug 16, 2016
Priority date
Expiry dateJul 3, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG21K2201/067
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An extreme ultraviolet mirror or blank production system includes: a first deposition system for depositing a planarization layer over a semiconductor substrate; a second deposition system for depositing an ultra-smooth layer over the planarization layer, the ultra-smooth layer having reorganized molecules; and a third deposition system for depositing a multi-layer stack over the ultra-smooth layer. The extreme ultraviolet blank includes: a substrate; a planarization layer over the substrate; an ultra-smooth layer over the planarization layer, the ultra-smooth layer having reorganized molecules; a multi-layer stack; and capping layers over the multi-layer stack. An extreme ultraviolet lithography system includes: an extreme ultraviolet light source; a mirror for directing light from the extreme ultraviolet light source; a reticle stage for placing an extreme ultraviolet mask blank with a planarization layer and an ultra-smooth layer over the planarization layer; and a wafer stage for placing a wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.