Patent · US Active

Alkaline pretreatment for electroplating

US9435049B2 · kind B2 · utility

8Cited by
62References
19Claims
0Family size

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Key dates

Filing dateNov 20, 2013
Grant dateSep 6, 2016
Priority date
Expiry dateJan 17, 2034

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC25D3/38
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Prior to electrodeposition, a semiconductor wafer having one or more recessed features, such as through silicon vias (TSVs), is pretreated by contacting the wafer with a pre-wetting liquid comprising a buffer (such as a borate buffer) and having a pH of between about 7 and about 13. This pre-treatment is particularly useful for wafers having acid-sensitive nickel-containing seed layers, such as NiB and NiP. The pre-wetting liquid is preferably degassed prior to contact with the wafer substrate. The pretreatment is preferably performed under subatmospheric pressure to prevent bubble formation within the recessed features. After the wafer is pretreated, a metal, such as copper, is electrodeposited from an acidic electroplating solution to fill the recessed features on the wafer. The described pretreatment minimizes corrosion of seed layer during electroplating and reduces plating defects.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.