Light activated test connections
US9437670B2 · kind B2 · utility
0Cited by
6References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 29, 2012 |
| Grant date | Sep 6, 2016 |
| Priority date | — |
| Expiry date | May 18, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test circuit including a light activated test connection in a semiconductor device is provided. The light activated test connection is electrically conductive during a test of the semiconductor device and is electrically non-conductive after the test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.