Method for testing differential analog-to-digital converter and system therefor
US9438262B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 22, 2015 |
| Grant date | Sep 6, 2016 |
| Priority date | — |
| Expiry date | Jun 22, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/12
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A method and circuit for testing an analog-to-digital converter (ADC) are provided. The method comprises: coupling a single-ended output of an analog signal source to a differential input of an amplifier; coupling a differential output of the amplifier to a differential input of the ADC; alternately providing first and second test signals from the single-ended output of the analog signal source to first and second input terminals of the differential input of the amplifier; amplifying the first and second test signals to generate amplified differential signals at the differential output of the amplifier; providing the amplified differential signals to the differential input of the ADC; and determining if an output of the ADC is as expected. An offset may also be provided to the differential output of the amplifier. The method allows an ADC having a differential input to be tested using a digital-to-analog converter (DAC) having a single-ended output.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.