Patent · US Active

Vacuum cleaning systems for polishing pads, and related methods

US9452506B2 · kind B2 · utility

2Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 31, 2014
Grant dateSep 27, 2016
Priority date
Expiry dateDec 9, 2034

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B53/017
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

Vacuum cleaning systems and related methods are disclosed. A polishing pad in combination with a fluid, such as a slurry, contacts a substrate to planarize material at the surface thereof and resultantly creates debris. A cleaning system includes an enclosure body having an inlet opening which may be placed proximate to the polishing pad and an exit opening in communication with a vacuum source to remove the debris and the fluid from the polishing pad through a passageway connecting the inlet and exit openings. By including contact members secured to the enclosure body and configured to form an abutment against a working surface of the polishing pad, a Venturi effect zone between the enclosure body and the working surface of the polishing pad may be created to dislodge fluid and debris from the working surface. In this manner, scratches and contamination are avoided for later-polished substrates.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.