Patent · US Active

Etch chemistries for metallization in electronic devices

US9455283B2 · kind B2 · utility

2Cited by
0References
27Claims
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Key dates

Filing dateMar 3, 2015
Grant dateSep 27, 2016
Priority date
Expiry dateMar 3, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02F2202/103
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

In various embodiments, etchants featuring (i) mixtures of hydrochloric acid, methanesulfonic acid, and nitric acid, or (ii) mixtures of phosphoric acid, methanesulfonic acid, and nitric acid, are utilized to etch metallic bilayers while minimizing resulting etch discontinuities between the layers of the bilayer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.