Patent · US Active

Methods and systems for use in grind shape control adaptation

US9457446B2 · kind B2 · utility

0Cited by
35References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 30, 2013
Grant dateOct 4, 2016
Priority date
Expiry dateNov 22, 2033

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B49/02
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A method of grinding wafers includes determining thickness variations in a wafer; determining incremental adjustments to spindle alignment based on best fit predictions of wafer shaper; and implemented the incremental adjustments to spindle alignment of a grind module.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.