David L. Grant
20Patents
11h-index
24Co-inventors
75Inventor score
Filing activity: Sep 13, 1988 → Apr 29, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6209023A | Supporting a SCSI device on a non-SCSI transport medium of a network | Physics | 174 | Expired |
| US5249279A | Method for controlling disk array operations by receiving logical disk requests and translating the requests to multiple physical disk specific commands | Physics | 109 | Expired |
| US5440716A | Method for developing physical disk drive specific commands from logical disk access commands for use in a disk array | Physics | 66 | Expired |
| US5592648A | Method for developing physical disk drive specific commands from logical disk access commands for use in a disk array | Physics | 62 | Expired |
| US6505268B1 | Data distribution in a disk array | Physics | 56 | Expired |
| US5909691A | Method for developing physical disk drive specific commands from logical disk access commands for use in a disk array | Physics | 40 | Expired |
| US6295578A | Cascaded removable media data storage system | Physics | 34 | Expired |
| US7477401B2 | Trench measurement system employing a chromatic confocal height sensor and a microscope | Physics | 34 | Active |
| US6842833B1 | Computer system and method for transferring data between multiple peer-level storage units | Emerging Cross-Sectional Technologies | 23 | Expired |
| US7738113B1 | Wafer measurement system and apparatus | Electricity | 21 | Active |
| US4941059A | Method for restoring computer files, including improved steps for location of head clusters of files | Emerging Cross-Sectional Technologies | 17 | Expired |
| US7121981B2 | Bilateral arm trainer and method of use | Human Necessities | 7 | Expired |
| US7850579B2 | Bilateral arm trainer and method of use | Human Necessities | 5 | Active |
| US5066482A | Compositions and method for controlling cockroaches | Human Necessities | 5 | Expired |
| US9714825B2 | Wafer shape thickness and trench measurement | Physics | 2 | Active |
| US8649016B2 | System for directly measuring the depth of a high aspect ratio etched feature on a wafer | Physics | 2 | Active |
| US6710864B1 | Concentricity measuring instrument for a fiberoptic cable end | Physics | 1 | Expired |
| US9587932B2 | System for directly measuring the depth of a high aspect ratio etched feature on a wafer | Physics | 0 | Active |
| US9457446B2 | Methods and systems for use in grind shape control adaptation | Performing Operations; Transporting | 0 | Active |
| US9952041B2 | Assessing alignment of top and bottom ends of TSVs and characterizing microfabrication process | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.