Test probe coated with conductive elastomer for testing of backdrilled plated through holes in printed circuit board assembly
US9459285B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 10, 2013 |
| Grant date | Oct 4, 2016 |
| Priority date | — |
| Expiry date | May 3, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2808
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test probe is provided for probing signal information on a back-drilled plated through hole connector formed in a printed circuit board, where the test probe includes a conductive probe body with a distal tip region extending a predetermined minimum coverage length (LTIP) that is longer than a recess depth dimension (DPL) for a recessed plating layer formed in the back-drilled plated through hole connector with an elastomer test probe tip formed around the distal tip region and having a total tip width (WTIP) which is compressed when inserted into the recessed plating layer formed in a back-drilled plated through hole connector, thereby establishing a conductive path between the conductive probe body and the recessed plating layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.