Patent · US Active

Dual storage node memory

US9461151B2 · kind B2 · utility

0Cited by
6References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 20, 2013
Grant dateOct 4, 2016
Priority date
Expiry dateSep 20, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B69/00
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An embodiment of the present invention is directed to a memory cell. The memory cell includes a first charge storage element and a second charge storage element, wherein the first and second charge storage elements include nitrides. The memory cell further includes an insulating layer formed between the first and second charge storage elements. The insulating layer provides insulation between the first and second charge storage elements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.