Methods and apparatus for cleaning semiconductor wafers

US9492852B2 · kind B2 · utility

Assignee

• ACM RESEARCH (SHANGHAI), INC. · CN

Inventors

• Jian Wang · Rosharon, US
• Sunny Voha Nuch · Shanghai, CN
• Liangzhi Xie · Shanghai, CN
• Junping Wu · Shanghai, CN
• Zhaowei Jia · Shanghai, CN
• Yunwen Huang · Shanghai, CN
• Zhifeng Gao · Shanghai, CN
• Yue Ma · San Jose, US
• Hui Wang · Shanghai, CN

Key dates

• Filing date: Mar 31, 2009
• Grant date: Nov 15, 2016
• Expiry date: Mar 9, 2033

Classification

• Technology area (CPC H): Electricity
• CPC primary: H01L21/67051
• WIPO field: Semiconductors
• WIPO sector: Electrical engineering

Abstract

A method for cleaning semiconductor substrate using ultra/mega sonic device comprising holding a semiconductor substrate by using a chuck, positioning a ultra/mega sonic device adjacent to the semiconductor substrate, injecting chemical liquid on the semiconductor substrate and gap between the semiconductor substrate and the ultra/mega sonic device, changing gap between the semiconductor substrate and the ultra/mega sonic device for each rotation of the chuck during the cleaning process by turn the semiconductor substrate or the ultra/mega sonic device clockwise or counter clockwise.