Identification and operation of sub-prime blocks in nonvolatile memory
US9501400B2 · kind B2 · utility
2Cited by
18References
18Claims
0Family size
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Key dates
| Filing date | Nov 13, 2013 |
| Grant date | Nov 22, 2016 |
| Priority date | — |
| Expiry date | Jan 18, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2212/7211
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In a block-erasable nonvolatile memory array, blocks are categorized as bad blocks, prime blocks, and sub-prime blocks. Sub-prime blocks are identified from their proximity to bad blocks or from testing. Sub-prime blocks are configured for limited operation (e.g. only storing non-critical data, or data copied elsewhere, or using some additional or enhanced redundancy scheme).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.