Methods of fabricating nanowire structures
US9508795B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 4, 2015 |
| Grant date | Nov 29, 2016 |
| Priority date | — |
| Expiry date | Feb 4, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D30/6757
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
Methods are presented for fabricating nanowire structures, such as one or more nanowire field effect transistors. The methods include, for instance: providing a substrate and forming a fin above the substrate so that the fin has a first sidewall including one or more elongate first sidewall protrusions and a second sidewall including one or more elongate second sidewall protrusions, with the one or more elongate second sidewall protrusions being substantially aligned with the one or more elongate first sidewall protrusions; and, anisotropically etching the fin with the elongate first sidewall protrusions and the elongate second sidewall protrusions to define the one or more nanowires. The etchant may be chosen to selectively etch along a pre-defined crystallographic plane, such as the (111) crystallographic plane, to form the nanowire structures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.