Patent · US Active

Method and apparatus for forming silicon film

US9558940B2 · kind B2 · utility

1Cited by
3References
3Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 15, 2014
Grant dateJan 31, 2017
Priority date
Expiry dateFeb 4, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76877
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of forming a silicon film in grooves formed on a surface of an object to be processed, the method including forming a first silicon film containing impurities so as to embed the first silicon film in the grooves of the object to be processed; doping the impurities in the vicinity of the surface of the first silicon film; expanding opening portions of the grooves by etching the first silicon film thereby forming expanded openings having grooves; and forming a second silicon film so as to embed the second silicon film in the grooves of the expanded openings is provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.