Patent · US Active

Process for etching metal using a combination of plasma and solid state sources

US9576810B2 · kind B2 · utility

36Cited by
10References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 29, 2014
Grant dateFeb 21, 2017
Priority date
Expiry dateMay 29, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/3343
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An apparatus configured to remove metal etch byproducts from the surface of substrates and from the interior of a substrate processing chamber. A plasma is used in combination with a solid state light source, such as an LED, to desorb metal etch byproducts. The desorbed byproducts may then be removed from the chamber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.