Patent · US Active

Metal-insulator-metal capacitor structure and method for manufacturing the same

US9577029B2 · kind B2 · utility

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Key dates

Filing dateNov 21, 2014
Grant dateFeb 21, 2017
Priority date
Expiry dateNov 21, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/716

Abstract

A metal-insulator-metal (MIM) capacitor structure and a method for manufacturing the same. The method includes a step hereinafter. A 5-layered dual-dielectric structure is provided on a substrate. The 5-layered dual-dielectric structure includes a bottom metal layer, a first dielectric layer, an intermediate metal layer, a second dielectric layer and a top metal layer in order. The first dielectric layer and the second dielectric layer have different thicknesses.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.