Patent · US Active

High purity metallic top coat for semiconductor manufacturing components

US9663870B2 · kind B2 · utility

7Cited by
11References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 13, 2013
Grant dateMay 30, 2017
Priority date
Expiry dateDec 13, 2033

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/12764
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A method for coating a component for use in a semiconductor chamber for plasma etching includes providing a component for use in a semiconductor manufacturing chamber, loading the component into a deposition chamber, cold spray coating a metal powder onto the component to form a coating on the component, and anodizing the coating to form an anodization layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.