Patent · US Active

Optical measuring method and measuring device having a measuring head for capturing a surface topography by calibrating the orientation of the measuring head

US9677871B2 · kind B2 · utility

7Cited by
32References
15Claims
0Family size

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Key dates

Filing dateMay 15, 2015
Grant dateJun 13, 2017
Priority date
Expiry dateJul 7, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B2210/50
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to an optical measuring process for acquiring a surface topography of a measurement object. To this end, a measuring device with a measuring head in a measuring head guide device is provided for chromatic confocal acquisition of the surface topography or for spectral interferometric OCT acquisition of the distance to the surface topography. Firstly, spectrally broadband light of a light source from a fiber array with i fibers of i measurement spots is directed onto the measurement object via a common measuring head optic, with formation of a spot array of i measurement spots. i reflection spectra of the i measurement channels are then acquired and digitized. Finally, the digitized reflection spectra are evaluated with removal of time variations of systematic measurement errors and time-related deviation movements of the measuring head guide device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.