Method for removing crystal originated particles from a crystalline silicon body
US9679774B2 · kind B2 · utility
1Cited by
4References
27Claims
0Family size
Assignee
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Key dates
| Filing date | Mar 18, 2014 |
| Grant date | Jun 13, 2017 |
| Priority date | — |
| Expiry date | Nov 29, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/107
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method for removing crystal originated particles from a crystalline silicon body having opposite first and second surfaces includes increasing a surface area of at least one of the first and second surfaces. The method further includes oxidizing the increased surface area at a temperature of at least 1000° C. and for a duration of at least 20 minutes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.