Patent · US Active

Multi zone heating and cooling ESC for plasma process chamber

US9681497B2 · kind B2 · utility

7Cited by
14References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 11, 2014
Grant dateJun 13, 2017
Priority date
Expiry dateMar 11, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/6833
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An electrostatic chuck assembly including a dielectric layer with a top surface to support a workpiece. A cooling channel base disposed below the dielectric layer includes a plurality of fluid conduits disposed beneath the top surface. A chuck assembly further includes a plurality of resistive heater rods spatially distribute across the chuck assembly. In embodiments, 169 heater rods and three heat transfer fluid flow controls are independently controlled during execution of a plasma etch process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.