Memory cell with read transistors of the TFET and MOSFET type to reduce leakage current
US9685222B2 · kind B2 · utility
1Cited by
2References
10Claims
0Family size
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Key dates
| Filing date | Oct 14, 2015 |
| Grant date | Jun 20, 2017 |
| Priority date | — |
| Expiry date | Oct 14, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C11/419
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Memory cell of the SRAM type, including storage transistors forming a memory point for storing a bit and a read port having at least one MOS transistor, a TFET transistor, a power terminal and a read bit line whereof a potential is designed to vary depending on the value of the stored bit, and such that:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.