Test apparatus
US9702929B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Oct 2, 2013 |
| Grant date | Jul 11, 2017 |
| Priority date | — |
| Expiry date | Jun 8, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/56008
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A judgment unit judges the pass/fail of DUTs. A power supply circuit has changeable characteristics, and supplies a power supply signal to the DUTs. A condition setting unit performs a pilot test before a main test for the DUTs, and acquires a test condition to be used in the main test. The condition setting unit executes: (a) measuring a first device characteristic value for each of multiple pilot samples sampled from among the DUTs while emulating a power supply characteristic close to what is used in a user environment in which the DUT is actually used; (b) measuring a predetermined second device characteristic value for each of the multiple pilot sample devices while emulating a power supply characteristic close to what is used in a tester environment in which the main test is performed; and (c) determining the test condition based on the first and second device characteristic values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.