Patent · US Active

Writing method for resistive memory cell and resistive memory

US9734908B1 · kind B1 · utility

4Cited by
1References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 22, 2016
Grant dateAug 15, 2017
Priority date
Expiry dateMar 22, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2013/0092
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A writing method for a resistive memory cell and a resistive memory using thereof are provided. In the writing method, a group of RESET signals is provided to the resistive memory cell, so as to execute a writing operation. A current of the resistive memory cell is detected to determine whether the writing operation of the resistive memory cell is completed. When the writing operation of the resistive memory cell is not completed, widths of filament paths in the resistive memory cell are determined to be narrowed or not. The voltage of word line of the resistive memory cell in the group of RESET signals is reduced when the widths of the filament paths in the resistive memory cell are narrowed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.