System and method for performing tear film structure measurement and evaporation rate measurements
US9757027B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 3, 2016 |
| Grant date | Sep 12, 2017 |
| Priority date | — |
| Expiry date | Aug 3, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30041
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method are described for performing tear film structure measurement. A broadband light source illuminates the tear film. A spectrometer measures respective spectra of reflected light from at least one point of the tear film. A color camera performs large field of view imaging of the tear film, so as to obtain color information for all points of the tear film imaged by the color camera. A processing unit calibrates the camera at the point measured by the spectrometer so that the color obtained by the camera at the point matches the color of the spectrometer at the same point. The processing unit determines, from the color of respective points of the calibrated camera, thicknesses of one or more layers of the tear film at the respective points. Other applications are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.